In this issue: Mechanical properties of phases in stainless steel, agronomy with handheld XRF, iron ore in accordance with ISO 9516:2003, full sample scanning of a large welding joint, RapidRSMTM for thin films, volume reconstruction with Bruker microCT, first S4 T-STAR installed, crystallography workshop report from Poland.
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Innovation with Integrity
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FIRST Newsletter |
December 2017, Issue 44 |
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Happy Chemistree!
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We have so many great things to share with you, this issue is simply overflowing with newsy gifts! Be sure to open them all!
May your holidays be sciency and bright!
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In This Issue
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By combining high resolution phase and grain orientation mapping with targeted nanomechanical measurements, our Hysitron PI 88 SEM PicoIndenter in conjunction with a QUANTAX EBSD system enables more complete characterization of metallic materials. In this application note, the location and mechanical properties of individual phases in Duplex 2205 stainless steel were measured. Read More |
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Bruker's portable XRF (pXRF) technologies help researchers, farmers and producers determine the presence of elemental nutrients and toxic metals in food, as well as the soil, fertilizers and irrigants used to grow plants. This article highlights agricultural applications of the S1 TITAN and TRACER 5i at a large dairy farm in Indiana, a soil-plant service lab in Kenya, and a tree-fruit center in Washington state. Read More |
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The S8 TIGER Series 2 sequential WDXRF spectrometer delivers very accurate and precise analytical results for the analysis of iron ore, in accordance with ISO 9516:2003. This article demonstrates the linearity (thanks to new HighSense counting electronics), stability, repeatability, and accuracy of the system using the provided calibration set and real iron ore samples. Read More |
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With its spacious sample chamber, micrometer spatial resolution and HyperMap position-tagged spectroscopy capability, the M4 TORNADO Micro-XRF system is ideal for materials analysis. Read this lab report to learn the advantages of full sample scanning over point analysis, and quantitative analysis methods for complex, structured samples, such as a large welding joint, on the M4 TORNADO. Read More |
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Reciprocal space mapping (RSM) with X-ray diffraction is useful for non-destructively measuring strain, composition and domain effects in the epitaxial thin films of semiconductor, optoelectronic, ferroelectric and spintronic devices. This report describes the application of RapidRSMTM to the measurement of RSMs in just 20 seconds from 3 compound semiconductor samples. Read More |
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To get suitable tomographical reconstruction data on a Bruker microCT system, movement of the object or source-detector pair can be done with either a circular or a helical scan trajectory. Special reconstruction algorithms, appropriate for particular acquisition geometries, can then suppress artifacts and significantly improve the accuracy of the reconstructed results. Read More |
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Introduced in 2016, the new S4 T-STAR TXRF spectrometer is designed to analyze different sample types on a variety of reflective carriers. The first S4 T-STAR system was installed at Tecnalia in San Sebastian, Spain. Expanding the Materials for Energy & Environment division's capabilities, the system will help researchers treat waste residues and recover raw materials. Read More |
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A two-day workshop on single crystal X-ray diffraction was held Oct 26-27 in the Biological and Chemical Research Centre at the University of Warsaw, Poland. Hosted by Professor Michał Cyrański and conducted by Dr. Tobias Stuerzer, the workshop presented practical aspects of SC-XRD experiments to more than 30 D8 VENTURE users from Poland and neighboring countries. Read More |
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Click to enlarge |
A round courgette (a type of squash, also known as zucchini) scanned with a SKYSCAN 1272. The grayscale images are two orthogonal slices; the color image was generated using the volume-rendering program, CTVox. |
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If you own Bruker equipment for single crystal structure analysis, we want to hear from you! Fill out our Customer Satisfaction Survey for a chance to win a new iPad. Drawings are held twice a year and winners are announced in FIRST Newsletter. Take Survey |
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Layer Analysis on Electron Microscopes |
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At Microscopy & Microanalysis 2017, Bruker introduced XMethod, the world's first software package for the analysis of composition and thickness of layered samples in conjunction with the XTrace microfocus X-ray source for scanning electron microscopes. Read More |
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30 Nov 2017 Mining for Money! - On-demand webinar: Learn how WDXRF technology can help you find hidden savings in your mining process 3-7 Dec 2017 Crystal 31 - Bunker Bay, Western Australia, Australia - 31st Biennial Conference of the Society of Crystallographers in Australia and New Zealand 5 Dec 2017 A Universal microCT Analysis Pipeline for Bone Preclinical Disease Models - Introductory webinar on CT-Analyzer and CT-Voxel, a powerful system for delivering quantitative results for bone analysis studies 5-8 Dec 2017 15th NCB International Seminar on Cement, Concrete and Building Materials - New Delhi, India - National Council for Cement and Building Materials
17-18 Jan 2018 GCC 2018 - Houston, TX, USA - Gulf Coast Conference - Serving the World of Chemical Analysis
22-25 Jan 2018 AME Roundup - Vancouver, BC, Canada - Association for Mineral Exploration 25-28 Feb 2018 SME Annual Conference - Minneapolis, MN, USA - Society for Mining, Metallurgy and Exploration 26 Feb - 1 Mar 2018 Pittcon 2018 - Orlando, FL, USA - Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy 18-21 Mar 2018 ARABLAB 2018 - Dubai, UAE - Annual Show for the Global Laboratory and Analytical Industry More Events & Tradeshows |
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© 2017 Bruker Corporation
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