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In this
issue: Mechanical properties of phases in stainless steel,
agronomy with handheld XRF, iron ore in accordance with ISO
9516:2003, full sample scanning of a large welding joint,
RapidRSMTM for thin films, volume reconstruction with
Bruker microCT, first S4 T-STAR installed, crystallography
workshop report from Poland.
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X-ray Diffraction
& Elemental Analysis
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Innovation with Integrity
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FIRST
Newsletter
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December 2017, Issue 44
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Happy Chemistree!
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We have so many great things to share with
you, this issue is simply overflowing with newsy gifts! Be sure
to open them all!
May your
holidays be sciency and bright!
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In This Issue
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By combining high resolution phase and
grain orientation mapping with targeted nanomechanical
measurements, our Hysitron PI 88 SEM PicoIndenter in
conjunction with a QUANTAX EBSD system enables more complete
characterization of metallic materials. In this application
note, the location and mechanical properties of individual
phases in Duplex 2205 stainless steel were measured.
Read More
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Bruker's portable XRF (pXRF) technologies
help researchers, farmers and producers determine the
presence of elemental nutrients and toxic metals in food, as
well as the soil, fertilizers and irrigants used to grow
plants. This article highlights agricultural applications of
the S1 TITAN and TRACER 5i
at a large dairy farm in Indiana, a soil-plant service lab in
Kenya, and a tree-fruit center in Washington state.
Read More
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The S8 TIGER Series 2 sequential
WDXRF spectrometer delivers very accurate and precise
analytical results for the analysis of iron ore, in
accordance with ISO 9516:2003. This article demonstrates the
linearity (thanks to new HighSense counting electronics),
stability, repeatability, and accuracy of the system using
the provided calibration set and real iron ore samples.
Read More
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With its spacious sample chamber,
micrometer spatial resolution and HyperMap position-tagged
spectroscopy capability, the M4 TORNADO Micro-XRF
system is ideal for materials analysis. Read this lab report
to learn the advantages of full sample scanning over point
analysis, and quantitative analysis methods for complex,
structured samples, such as a large welding joint, on the M4
TORNADO.
Read More
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Reciprocal space mapping (RSM) with X-ray
diffraction is useful for non-destructively measuring strain,
composition and domain effects in the epitaxial thin films of
semiconductor, optoelectronic, ferroelectric and spintronic
devices. This report describes the application of RapidRSMTM
to the measurement of RSMs in just 20 seconds from 3 compound
semiconductor samples.
Read More
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To get suitable tomographical
reconstruction data on a Bruker microCT system, movement of the
object or source-detector pair can be done with either a
circular or a helical scan trajectory. Special reconstruction
algorithms, appropriate for particular acquisition
geometries, can then suppress artifacts and significantly
improve the accuracy of the reconstructed results.
Read More
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Introduced in 2016, the new S4 T-STAR TXRF spectrometer
is designed to analyze different sample types on a variety of
reflective carriers. The first S4 T-STAR system was installed
at Tecnalia in San Sebastian, Spain. Expanding the Materials
for Energy & Environment division's capabilities, the
system will help researchers treat waste residues and recover
raw materials.
Read More
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A two-day workshop on single crystal
X-ray diffraction was held Oct 26-27 in the Biological and
Chemical Research Centre at the University of Warsaw, Poland.
Hosted by Professor Michał Cyrański and conducted by Dr.
Tobias Stuerzer, the workshop presented practical aspects of
SC-XRD experiments to more than 30 D8 VENTURE users from Poland
and neighboring countries.
Read More
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Click to enlarge
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A round courgette (a type of squash, also
known as zucchini) scanned with a SKYSCAN
1272. The grayscale images are two orthogonal
slices; the color image was generated using the
volume-rendering program, CTVox.
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If you own Bruker equipment for single
crystal structure analysis, we want to hear from you! Fill out
our Customer
Satisfaction Survey for a chance to win a new
iPad. Drawings are held twice a year and winners are announced
in FIRST
Newsletter.
Take
Survey
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Layer
Analysis on Electron Microscopes
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At Microscopy & Microanalysis 2017,
Bruker introduced XMethod, the world's first software package
for the analysis of composition and thickness of layered samples in
conjunction with the XTrace microfocus X-ray source for
scanning electron microscopes.
Read More
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30 Nov 2017
Mining for Money! -
On-demand webinar: Learn how WDXRF technology can help you
find hidden savings in your mining process
3-7 Dec 2017
Crystal
31 - Bunker Bay, Western Australia,
Australia - 31st Biennial Conference of the Society of
Crystallographers in Australia and New Zealand
5 Dec 2017
A Universal microCT
Analysis Pipeline for Bone Preclinical Disease Models -
Introductory webinar on CT-Analyzer and CT-Voxel, a powerful
system for delivering quantitative results for bone analysis
studies
5-8 Dec 2017
15th
NCB International Seminar on Cement, Concrete and Building
Materials - New Delhi, India - National Council
for Cement and Building Materials
17-18 Jan 2018
GCC
2018 - Houston, TX, USA - Gulf Coast Conference
- Serving the World of Chemical Analysis
22-25 Jan 2018
AME
Roundup - Vancouver, BC, Canada - Association
for Mineral Exploration
25-28 Feb 2018
SME
Annual Conference - Minneapolis, MN, USA -
Society for Mining, Metallurgy and Exploration
26 Feb - 1 Mar 2018
Pittcon
2018 - Orlando, FL, USA - Pittsburgh
Conference on Analytical Chemistry and Applied Spectroscopy
18-21 Mar 2018
ARABLAB
2018 - Dubai, UAE - Annual Show for the
Global Laboratory and Analytical Industry
More
Events & Tradeshows
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© 2017 Bruker
Corporation
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Connect
with us:
     
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Bruker
AXS Inc. | 5465 East Cheryl Parkway | Madison, WI
53711 | USA
Phone +1 (800) 234-9729 | info.baxs [at]
bruker.com
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