The content for this course is catered towards users who are more familiar / have some prior experience with X-ray Diffraction.
Workshop contents:
Day 1: 23 Nov (Wed), 09:30 AM - 04:30 PM
Morning (Hybrid Mode - Online on Zoom or In-person)
- Introduction to Rietveld Analysis
- Good Diffraction Practice – Why Collecting Good Data is Important
Afternoon (In-person, limited slots available)
- Hands-on session (Quantitative analysis and Rietveld structure analysis)
Day 2: 24 Nov (Thurs), 09:30 AM - 04:30 PM
Morning (Hybrid Mode - Online on Zoom or In-person)
- Introduction to PDF analysis
- Examples of PDF applications
- TOPAS V7 - Introduction to Launch mode
Afternoon (In-person, limited slots available)
- Hands-on session (Evaluate data for PDF analysis, including data processing and refinement)
Venue
Registration Details
Complimentary, with lunch for attendees of the hands-on sessions.
Presenters:
Dr. Michael Evans, Application Scientist, X-ray Diffraction, Bruker AXS GmbH
Dr. Manoel Manuputty, Application Scientist, X-ray Diffraction, Bruker Singapore
Dr. Samuel Morris, Facility for Analysis, Characterisation, Testing and Simulation (FACTS), NTU
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