|
XRD2, or X-ray diffraction by means of a 2-dimensional detector, has become an essential part of the modern materials science diffractometer.
In the last 2 decades, XRD2 has demonstrated strong speed and accuracy benefits for traditional applications such as texture, residual stress, and micro-diffraction phase ID. The versatility of the current generation of diffractometers, which facilitate measurements ranging from coupled scans to in-plane grazing geometries, has set the stage for the next evolution of XRD2 applications for the materials scientist.
In this 1-hour webinar, Jon Giencke, Sr. Application Scientist for XRD2, will give an overview of 2D diffraction geometry and present modern and innovative applications which highlight the unique capabilities of XRD2 including:
- Crystallite size by gamma-profile analysis
- Characterization of ultra-thin epitaxial films and superlattices
- Single crystal orientation analysis using Laue diffraction
- Miscut angle determination of single crystal substrates
- Retained Austenite analysis with 2D
Watch our D8 DISCOVER (XRD2) Video
Can't make the live webcast? Register now for session 1 (9 AM CDT) or session 2 (2 PM CDT) and we'll send you a copy of the slides and a link to the recording for later viewing at your convenience. All are welcome and there is no charge to attend.
We look forward to seeing you there!
Bruker Webinars
webinars@bruker.com
| 
