In this issue: Solid angle and why it's important, new Bruker applications lab and specialist, Transmission Kikuchi Diffraction in SEM, free EDS on TEM poster
Bruker: Innovation with Integrity
 

  EDS, WDS, EBSD, Micro-XRF
and Micro-CT for SEM

ESPRIT



Microanalysis News
July 2014


   


Summer has finally arrived in New Jersey, and not a moment too soon! The sun is shining, the trees are fully green and the Garden State is living up to its name.

This past year our engineers have been busy developing new instruments and improving existing ones. Some of you may know that we recently introduced both a WDS system and an on-column micro-XRF system. Both of these systems run under our ESPRIT software platform, so if you already know how to run a Bruker EDS you’ll have no trouble learning how to run either one of these.

And speaking of new techniques, there has been a lot of buzz lately about a new technique for EBSD called Transmission Kikuchi Diffraction, or TKD. Using your existing EBSD system, you can now study the crystalline structure of nano-scale materials in your SEM. You’ll need to prepare your samples as for a TEM and mount them so the beam passes through the sample, but our new TKD toolkit makes this easy.  Read more about it below.

We’ve recently opened a new applications lab in Billerica, MA, and we are very pleased to announce the addition of Hosanna Lillydahl-Schroeder to our applications support team. If you're shopping for a new EDS system, you probably hear a lot about active area, small diameter end caps, and multiple detector. All of those features are designed to maximize count rate, which really means we are trying to increase solid angle. If you’d like to learn more about solid angle and how it can affect your test results, we’ve put together a nice tutorial to explain it all. You can read all about in our article titled “What is Solid Angle and Why is it Important?”

We hope you enjoy this issue of Microanalysis News, and if you have suggestions or contributions for future issues, please let us know. As always, we don't share your email address with anyone, and if you would like to be removed from our mailing list, just follow the instructions at the bottom of this newsletter. Thank you for trusting us with your email address.

Don Becker
Regional Sales Manager – Americas


What is Solid Angle and Why is it Important?

Solid AngleWhen performing an EDS experiment, we always try to maximize our count rate. This gives us better statistics and minimizes our acquisition time. One of the things that directly affects count rate is solid angle. This article examines the variables that affect solid angle, and therefore count rate, and the impact those variables have on experimental results. Learn more
 

New Applications Lab and New Applications Specialist

Bruker BillericaWe are excited to announce the opening of our newest applications lab at the Bruker campus in Billerica, Massachusetts. Equipped with a new Field Emission SEM with EDS, EBSD, and on-column XRF, the new facility will expand our demo capabilities while providing more opportunity to interact with our customers. Going forward, our user schools will be conducted at the new lab to take advantage of the classroom facilities available on the Bruker campus.

The address of our new lab is:

Bruker Nano Analytics
19 Fortune Drive
Billerica, MA  01821

Hosanna Lillydahl-SchroederTo help staff our new applications lab, we are pleased to announce the addition of Hosanna Lillydahl-Schroeder to our applications support team. Hosanna holds a B.S. in Geology from the University of Massachusetts, Amherst and an M.S. from Boston College. He has used SEM and EPMA techniques to conduct research in mineralogy, geochemistry, and rock deformation. Hosanna will be the principle operator of our new Field Emission SEM, and will be available for demos and customer training.

 

Transmission Kikuchi Diffraction in SEM

TKD sample holderA new technique called  Transmission Kikuchi Diffraction, or TKD, has been developed as an SEM-based method capable of delivering the same type of results as EBSD, but with a spatial resolution improved by up to one order of magnitude. Utilizing existing EBSD hardware and software, TKD can be used to study electron-transparent samples, such asTEM lamella, free-standing films and crystalline nanoparticles.

Recognizing the potential of this new technique, Bruker decided to integrate it into the QUANTAX EBSD system. The TKD mode in QUANTAX EBSD is designed to be user friendly and allow the acquisition of high quality data regardless of the users’ experience level. TKD analyses with QUANTAX EBSD also can be combined with EDS analyses, thanks to a special sample holder designed by Bruker. Find out more


 

llUpcoming Events

 


DXC

Big Sky, MT
July 28 - 31

M&M
Hartford, CT
August 3 - 7

EDS User Training
Ewing, NJ and
Billerica, MA

 

 
 
 

llOn-Demand Webinars

 

Just because you weren’t able to participate in one of our live webinars doesn’t mean you
missed it – we routinely record and post webinars on our website for on-demand viewing. The two most recent recorded webinars are linked below, or you can see the entire on-demand library here.

Feature analysis Advancing Feature Analysis and Spectrum Imaging in SEM
 
XTrace Micro-XRF Advanced Materials Analysis with Micro-XRF for SEM

 

 
 
 

ll2014 User School Schedule

 

As part of our continuing customer support and training program, Bruker periodically offers short courses in X-ray Microanalysis and instruments at our Ewing, NJ headquarters, and now at our new applications lab in Billerica, MA. These courses are ideal for new users, as well as experienced users looking to learn new techniques. Classes run from Monday at 9:00 AM through mid-afternoon on Thursday.

  • Billerica       Jul 14-17
  • Billerica       Sep 08-11
  • Billerica       Nov 10-13

Download a registration form

Download a course outline

 
 
 

llFree EDS on TEM Poster

 

We still have a limited number of our popular EDS on TEM posters available. This full-color 24" x 36" poster explains X-ray micro-analysis on TEM, complete with cut-away views of detectors, the TEM column, and explanations of basic EDS techniques. To get your free copy, just fill out our Information Request Form and ask for your free TEM microanalysis poster.

MA on TEM poster
 
 
 

llBruker Nano Analytics

 

1239 Parkway Ave, Suite 203
Ewing, NJ 08628
Tel: +1 609 771 4400
Fax: +1 609 771 4411
www.bruker.com
info-ewing@bruker-nano.com

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