Crystallography is advancing into a new era characterized by rapid data measurements and increasing processor speeds. This progress enables real-time data processing and the analysis of datasets collected under various conditions, allowing researchers to study changes in crystal structures in response to additional variables such as time, temperature, and pressure. These practices have now become standard in the field.
Additionally, cloud computing and enhanced connectivity are shaping the landscape of scientific investigations, promising more efficient processes in the future.
APEX5 represents the latest release of the widely popular software. It introduces several new features crucial for the future utilization of crystallographic software. APEX5 now serves as a central hub for running all crystallography programs. Furthermore, CIRRUS assists central labs in managing sample submissions and delivering results faster and more reliably through our cloud data exchange server.
To help users fully utilize APEX5's new features, Bruker AXS has organized a comprehensive program of online and in-person workshops scheduled throughout 2024. Our first online seminar on 22nd May discusses how APEX5 can help to unlock the efficiency of your instrument. Register now for the session that best fits you schedule: May 22 at 9 AM CEST or May 22 at 4 PM CEST.
For those new to crystallography, check out our upcoming online seminar, Getting Started in Crystallography, on 19th June. Registration will open soon. Please look for an invitation in your inbox.
Two exceptional opportunities await experienced crystallographers interested in mastering more advanced tools. These opportunities are the APEX5 and SHELXLE workshops, which will be held at the American Crystallographic Association (ACA) Annual Meeting in July in Denver, Colorado, and the European Crystallographic Meeting (ECM) in August in Padova, Italy.
A series of in-person workshops is scheduled in Singapore, Germany and many other locations around the world.
To stay up to date with our program of APEX5 educational events, visit our Events webpage or check out the Events section of this and future issues of FIRST Newsletter.
Grazing Incidence Diffraction (GID) is a method for studying polycrystalline thin films. These samples usually show a very weak diffraction signal arising from the thin film in Bragg-Brentano symmetric diffraction because the X-rays pass through the thin film into the underlying substrate, which dominates the resulting signal due to its larger scattering volume. If, however, instead of the divergent beam path of the Bragg-Brentano geometry, a thin parallel beam is directed at the sample surface so that it penetrates only the thin film, but not the underlying substrate, the resulting signal from the film is dominant. By optimizing the angle of incidence of the parallel beam, it is possible to decouple the scattering signal of the layer from that of the substrate. In the D6 PHASER, double slit collimation is used to produce the parallel beam. The resulting data can be used for phase identification, film thickness measurement, and residual stress analysis with depth variation controlled by the angle of incidence.
Bruker’s analytical X-ray solutions are used along the entire battery life cycle. In this article, we discuss how X-Ray Diffraction (XRD) is used to further our understanding of energy storage systems by providing valuable insights into dynamic processes occurring in battery cells. The D8 ADVANCE, when equipped with hard radiation Mo source, is the perfect tool for operando experiments on pouch cells. Combined with the large field-of-view of an EIGER2 R 500K detector, complete diffraction patterns over a wide angular range can be collected in a single shot. Consequently, hundreds or thousands of datasets can be measured during the course of a cycling experiment, providing fine details about structural changes occurring in a battery cell. The whole experiment, including control of the electrochemical cell, is planned, carried out, and evaluated in DIFFRAC.SUITE.
Materials testing is essential to qualifying ceramics at various stages of the production cycle – from raw materials verification to characterizing finished formed parts. In this article, originally published in ACerS Bulletin March 2024, we highlight several key instrumental methods for chemical and structural analysis of ceramics: X-Ray Fluorescence in both bulk- and microscale applications (XRF and µXRF, respectively), powder X-Ray Diffraction (XRD), and X-Ray Microscopy (XRM). A high-level overview and relevant examples from each method, as well as a case study using multiple techniques to more thoroughly analyze two injection-molded ceramic components, are presented.
* Source: American Ceramic Society (ACerS) Bulletin, March 2024
X-Ray Fluorescence (XRF) spectrometry is a powerful tool in the exploration and mining industry. It delivers immediate, actionable data for tasks such as blast hole analysis, mineral beneficiation, and grade control. XRF also plays a crucial role in meeting environmental regulations, particularly for tailings and wastewater analysis. There are two main XRF techniques: energy-dispersive (EDXRF) and wavelength-dispersive (WDXRF). Choosing the right technique depends on factors like elements of interest, concentration ranges, number of samples per day, and required analytical precision. On March 12th more than 1000 registrants enjoyed our interactive online seminar about XRF applications in mineral and metal mining. In two lab sessions, we demonstrated our spectrometers and shared valuable tips. Did you miss the event? Get access to the recording, presentation, and Q&A summary.