Bruker AXS has a long history of developing and supporting the world's most popular single-crystal X-ray diffractometers. For over 40 years we have been partners to many of the world's leading crystallographers, across wide-ranging research fields, from drug discovery via the chemical sciences to the materials sciences.

Behind this success is our belief in a comprehensive approach to supporting our users to ensure they get the most from their instruments, from training new crystallographers to providing professional instrument and methods support.

But everything starts with the production of high-quality instruments with the best possible performance. Prof. Christian Lehman from the Max Planck Institute recently visited the Bruker AXS factory in Karlsruhe and was shown how our instruments are assembled, from the initial fabrication of component parts to the final assembly and testing of the completed instrument. You can join Prof. Lehman on the tour by watching our Single Crystal Solutions for the Best Possible Data video.

Bruker AXS is committed to fostering lasting partnerships with our users. We achieve this by organizing regular training sessions, workshops, and users’ meetings throughout the year. The most recent users' meeting took place last month in Karlsruhe. More than sixty participants from across Europe took the opportunity to spend a day in our Application Labs, meeting old friends and discussing the latest methods in crystallography. The following day gave our users a chance to present their latest findings in a program of short talks. The talks were very interesting and engaging. It is always a pleasure to see our users pushing back the boundaries of science.

Check our SC-XRD Upcoming Events page for future events in your region, and we hope to see you soon!

Join us for a live online seminar, this Wednesday, November 15^th, on X-Ray Fluorescence (XRF) spectrometry and its applications along the battery value chain. From manufacturing to recycling, we’ll cover it all. Discover the importance of elemental analysis in the upstream production process and learn how XRF is used in battery recycling. Our experts will showcase our XRF spectrometers and answer all your questions. Don’t miss this opportunity to learn what XRF can do for you in this exciting new field!

Since X-Ray Diffraction (XRD) is sensitive to a material's atomic structure, it can be used to measure the degree of orientation, or texture, of crystallites in a sample. A perfect powder exhibits completely random, or isotropic, texture, whereas most metals exhibit strong texture due to deformation during processing. Our D6 PHASER, with its universal stage and phi rotation module, is the perfect system for measuring texture. In this application report, we present the results from texture analysis of a piece of aluminum. Using DIFFRAC.TEXTURE software, a series of phi scans were carried out for three Al reflections and the data were converted into pole figures. Strong [111] texture was observed in the rolling direction of the sample, as well as fibers in the normal and transverse directions.

Treat your X-ray diffractometer and start the new year off right with our end-of-the-year tube sale at the Bruker Store! From now until December 22^nd, enjoy a 10% discount on all sealed Cu X-ray tubes. Our high-quality tubes will boost the performance of your diffractometer, ensuring that you start the new year at peak performance. Not sure which tube fits your diffractometer? Simply click on a tube item and check the "Compatibilities" section before adding the item to your cart. Don’t miss out on this perfect opportunity to enhance your equipment – your diffractometer will thank you!

Do you care about coating thicknesses or material homogeneity in more than just one spot on your products? Are you manufacturing solar thin-film panels or hard disk drives? Would you like to analyze larger samples, without trimming them, to monitor your production processes? Then you should check out the S2 PUMA Series 2 with Linear Motion Stage. This EDXRF spectrometer makes at-line multi-position quality monitoring simple and highly reproducible. It can handle large samples up to 152 mm x 152 mm (6 in x 6 in) in size, with a spot size as small as 1 mm. You can measure material homogeneity or coating thickness in a spatial way with just one click: quickly, accurately, and non-destructively!

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