Bruker X-Ray Diffraction (XRD) software is continually being developed to increase both power and usability of our solutions. We would like to share some recent updates to the XRD measurement and analysis software.
DIFFRAC.SUITE, our measurement software, has now been updated to version 8. To increase the overall speed and responsiveness of the interface, the core has been upgraded to 64-bit. Many new and exciting hardware releases are now supported, including the D8 DISCOVER Plus with Non-Coplanar Arm, potentiostat control for battery measurements, and the new EIGER2 R 250K detector. In addition, several tools have been added to assist with method setup, including a beam geometry calculator, enhancements to High Resolution X-Ray Diffraction (HRXRD) alignment, and extensions to the result manager.
DIFFRAC.EVA is used for inspecting results, performing phase identification, and running semi-quantitative analysis. Version 6 brings improvements in these areas and more. To increase performance, 64-bit and multi-core processors are now supported. Search/Match has received an improved heuristic automatic search algorithm, an automatic displacement function which assesses systematic peak displacements, and a line matching view that quickly shows the correlation between scan peaks and selected phases. After the phase identification has been completed, a project file can now be saved, which includes instrument parameters and structure files, ready for import into DIFFRAC.TOPAS for quantitative refinement. There have also been improvements to cluster analysis, semi-quantitative analysis for all materials (SQUALL), and Positive Material Identification (PMI) tools. SQUALL now includes a quantification based on the Direct Derivation Method (DDM).
DIFFRAC.XRR provides a powerful solution for the analysis of X-Ray Reflectivity (XRR) data for thickness, density and roughness of thin films. Thickness can be determined with a single click with the FFT method, or full modeling can be performed by building a sample with a new simple-to-use materials database and refined optimization algorithms. New in version 2, analysis can be performed on multi-scan data sets from sources such as wafer maps or non-ambient measurements.
These are only a few of the new features found in the new software releases. For a complete list, please check the Bruker website and Bruker Support. The X-Ray Diffraction software team is actively working on more innovations.