Bruker X-Ray Diffraction (XRD) software is continually being developed to increase both power and usability of our solutions. We would like to share some recent updates to the XRD measurement and analysis software.

DIFFRAC.SUITE, our measurement software, has now been updated to version 8. To increase the overall speed and responsiveness of the interface, the core has been upgraded to 64-bit. Many new and exciting hardware releases are now supported, including the D8 DISCOVER Plus with Non-Coplanar Arm, potentiostat control for battery measurements, and the new EIGER2 R 250K detector. In addition, several tools have been added to assist with method setup, including a beam geometry calculator, enhancements to High Resolution X-Ray Diffraction (HRXRD) alignment, and extensions to the result manager.

DIFFRAC.EVA is used for inspecting results, performing phase identification, and running semi-quantitative analysis. Version 6 brings improvements in these areas and more. To increase performance, 64-bit and multi-core processors are now supported. Search/Match has received an improved heuristic automatic search algorithm, an automatic displacement function which assesses systematic peak displacements, and a line matching view that quickly shows the correlation between scan peaks and selected phases. After the phase identification has been completed, a project file can now be saved, which includes instrument parameters and structure files, ready for import into DIFFRAC.TOPAS for quantitative refinement. There have also been improvements to cluster analysis, semi-quantitative analysis for all materials (SQUALL), and Positive Material Identification (PMI) tools. SQUALL now includes a quantification based on the Direct Derivation Method (DDM).

DIFFRAC.XRR provides a powerful solution for the analysis of X-Ray Reflectivity (XRR) data for thickness, density and roughness of thin films. Thickness can be determined with a single click with the FFT method, or full modeling can be performed by building a sample with a new simple-to-use materials database and refined optimization algorithms. New in version 2, analysis can be performed on multi-scan data sets from sources such as wafer maps or non-ambient measurements.

These are only a few of the new features found in the new software releases. For a complete list, please check the Bruker website and Bruker Support. The X-Ray Diffraction software team is actively working on more innovations.

Portable XRF (PXRF) is a fast, easy and economical tool for the analysis of precious metals recovered upon recycling of Automobile Catalytic Converters (ACCs). Bruker PXRF analyzers can be pre-loaded with a comprehensive Catalysts Calibration which includes rhodium, palladium, and platinum, as well as 19 other elements. This means that, out of the box, Bruker PXRF analyzers are ready to measure ACC samples and provide chemical composition results. Simply place the sample in position on the analyzer, select "CarCatalysts Application", and press the start trigger. Our CTX portable and S1 TITAN handheld XRF analyzers can both be equipped with the catalytic converter application.

Introducing our new Podcast Station: “Solutions for NanoAnalysis”. We currently have five sessions available to listen to and share. These can also be found on most places people subscribe to podcasts. We plan to release at least one a month from now until June 2022. We are looking for customers to interview about their results and interesting stories. If you have an idea, please let us know!

• Finding the Right Tool for the Right Question - Douglas Stauffer, Bruker Hysitron, with Peter Hosemann, University of California, Berkeley
• Steel Analysis with M4 TORNADO - Tina Hill, Bruker Micro-XRF, with Geoff West, University of Warwick
• Big Power in a Tabletop SEM - EBSD with the new Bruker ED-XS - Daniel Goren, Bruker EBSD, with Mike Toalson, Coxem
• Dust Bunnies in Space - Dr. Kristen Bunker, RJ Lee Group, with Dr. Marit Meyer, NASA Glenn Research Center
• Foreign Objects Found in Food - Kim Russell, Bruker HH-XRF

The SKYSCAN 1275 is a high performance benchtop X-Ray Microscope (XRM) that offers push-button analysis for ultimate ease-of-use. Equipped with a powerful X-ray source and flat panel detector, non-destructive three-dimensional imaging of a sample's interior can be performed to reveal what is missed with conventional surface microscopy. The SKYSCAN 1275 lets you see what's inside a wide variety of sample types, including pharmaceutical tablets, energy storage cells, and geological specimens.  

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