In this issue:  Supporting the frontline response to COVID-19, "what is X-ray microscopy?" videos, Allied BioScience uses TRACER 5i to monitor antimicrobial coatings, EAF slag analysis with the S2 PUMA Series 2, PHOTON III upgrades to boost your SC-XRD detector performance, new e-Flash XS EBSD detector for SEMs, CS/ONH and OES online training courses on, news from our Bruker AXS Service Team, ESPRIT Offline software licenses now available, and region-of-interest selection in XRM images.




Innovation with Integrity



X-ray & Elemental Analysis

June 2020, Issue 53

Supporting the Frontline Response to COVID-19

We are all part of a complex supply chain in a globalized world, with all its advantages and disadvantages. Bruker stands for integrity in all areas, so we also strive for integrity in managing the current situation. At Bruker, we track our supply chain end-to-end, from purchasing to production to delivery, and take preventive actions to ensure continuity of business operations.


Frank H. Laukien, Ph.D., President and CEO of Bruker Corporation, commented: First and foremost, our concern is for the safety and health of our employees and their families, as well as for that of our customers and partners. We support many customers in their important research and development, analytical and diagnostic testing, as well as product safety and quality assurance, which are and will remain a high priority for our societies. With our enabling life science and diagnostic tools, we are particularly pleased to provide essential research and service support for infectious disease research, for anti-viral vaccine and therapeutic drug discovery and development, as well as for clinical microbiology and viral testing in support of the fight against the COVID-19 pandemic.


In view of the continuing shortage of protective materials for hospital staff during the coronavirus crisis, experts from Helios Kliniken GmbH in Germany have developed a safe procedure for reprocessing filtering face piece (FFP) masks in recent weeks. Our partner RJL Micro & Analytic GmbH supported development by testing the structural properties of the FFP protective masks before and after reprocessing using a Bruker X-ray microscope and electron microscopy. The structural integrity of the masks treated according to the Helios procedure was confirmed. The reprocessing process is accompanied by an intensive quality management system and is permanently monitored. RJL will continue to support the project in the future and will be closely involved in a concept for continuous quality control.


Please continue to join us in our Virtual Events and Bruker Training Office Hours. We wish you good health and success, and we look forward to seeing you online soon.


In This Issue

What is X-ray Microscopy?

Our new videos explain the basic concepts of 3D X-ray Microscopy (XRM) using micro computed tomography (micro-CT), a materials scanning and visualization technique built into our SKYSCAN instruments.

Watch "What is XRM?" video

Watch Bruker Live from the Lab streaming series 
Season 1 Episode 1: What is X-ray Microscopy?



Case Study: Allied BioScience

Allied BioScience uses Bruker TRACER 5i spectrometers as part of their proprietary and patent-pending methodology to monitor the efficacy of their antimicrobial coatings that reduce the presence of surface germs.
Read more


S2 PUMA Series 2: EAF Slag Analysis

This lab report demonstrates the excellent capabilities of the S2 PUMA for EAF slag analysis in steel plants. The combination of the high-power X-ray tube with the HighSense detector enables the S2 PUMA to accurately monitor slag composition in just 2 minutes counting time!
Read more



Boost Your Detector Performance with a Plug and Play PHOTON II to PHOTON III Upgrade


Upgrading your PHOTON II to the latest PHOTON III performance has never been easier and more straightforward. With a simple swap of the detector control and digital signal processing unit, your PHOTON II detector will be enhanced with increased processing power and updated firmware. This upgrade will give you access to higher sensitivity modes, photon-counting and High Energy Event Discrimination (HEED).

  • Faster data collection on weakly diffracting samples
  • Access to structures from smaller crystals
  • Improved powder patterns with HEED

Case Study 6: Powder Diffraction Experiments with the PHOTON III

Case Study 7: Upgrading to the Photon Counting PHOTON III Detector

Application Note: The New PHOTON III Detector with Photon Counting in Mixed-Mode Detection - A PHOTON II versus PHOTON III comparison



The New e-Flash XS: Simplicity is the Ultimate Sophistication!

Bruker Nano has developed e-Flash XS, a unique EBSD detector, purposely designed to be affordable and installed on low footprint SEMs, e.g. tabletop SEMs and standard SEMs with small chambers.
Read more



CS/ONH and OES Online Training Courses Now Available on

Need a quick tutorial on how to operate or maintain your Bruker CS/ONH or OES analyzer? Online training courses are now available on Once you register your instrument(s) on, the corresponding courses will be available in the Training section.
Read more



Bruker AXS Service & Support News


Your Bruker AXS Service Team stands at the ready worldwide to support you during the ongoing pandemic and beyond.

To provide you with uninterrupted support of your Bruker AXS instruments, we are continuing use of our online-support merged-reality Virtual Engineer solution. This tool allows us to remotely support any site restricting onsite access but requiring a service visit.

We understand that funding is difficult at present, but we can help! Bruker AXS Service is offering a 10% discount on all X-ray tubes for XRD, SC-XRD and XRF instruments through the end of August 2020. Order your preventative maintenance visit together with a new tube and we will even install your new tube for free. Register now to take advantage of our Mid-Year Tube Sale and place your order before August 31st!

Whether you're looking for a higher-performing detector, software upgrade, special sample holder or other accessories for your Bruker AXS system, our Service Team also would be happy to assist you. Simply contact your Bruker AXS Service Engineer or local support office -- they will point you in the right direction for getting the most out of your instrument.


News for the ESPRIT User: ESPRIT Offline Software Now Available


ESPRIT Offline is the free, time-limited, offline license for the whole ESPRIT software suite that lets you analyze your Bruker EDS, EBSD, µ-XRF and WDS data without the need to access your laboratory system.  
Get yours  


XRM: All About Region-of-Interest Selection

In Micro-CT / XRM, a region of interest is a user-defined region within the acquired image volume covering features of interest. Method Note 131 contains a worked example of defining an ROI for subsequent segmentation of mouse lungs.
Read more

Must-See Bruker TV

Carbon & Sulfur Analysis by Combustion - Watch this video to learn how Bruker CS analyzers, such as the G4 ICARUS Series 2, perform elemental analysis on ferrous and non-ferrous metals, their alloys, ceramics, ores, cement, limestone and numerous other inorganic solids.

Image of the Month

A pharmaceutical drug for oral medication in the form of an enteric-coated granule was scanned with a SKYSCAN 1272 at a pixel size of 0.45 micron. The enteric coating protects the active pharmaceutical ingredient (API) against the acidic environment in the stomach, and delays release until the granule arrives in the small intestine. In this image, the coating consists of three layers. A smooth and homogeneous coating, in particular of the outer layer, is crucial for efficient drug uptake. The image shows several granules with the outer layer color-coded for the thickness in 3D.SUITE.
Click to enlarge

Bruker Training Office Hours

Open to existing users of Bruker 
X-ray DiffractionX-ray Microscopy
X-ray FluorescenceCS/ONH AnalysisOptical Emission Spectrometry, and Single Crystal
X-ray Diffraction
 instruments, Bruker Training Office Hours are free, 1-hour, online, live, interactive, weekly Applications Training sessions, offered in three different time zones and multiple languages. Sign up once for a series and attend as many of its live weekly sessions as you like. Drop in for a few minutes or stay the hour, learn new methods during the brief training presentation, chat with your fellow attendees, bring your questions, and discuss your applications with our experts.
Check Schedule & Sign Up

Virtual Events for X-ray Diffraction and Elemental Analysis

There has never been a better time to learn something new.

Bruker AXS is committed to keeping you up to date on the latest in our solutions and applications. This webpage will serve as your resource for all of our upcoming X-ray Diffraction, Microscopy, and Elemental Analysis digital events, including webinars, online trainings, and virtual meetings.
Join us online!

Pre-owned Systems Available

Bruker offers pre-owned and demo systems for an attractive price. All systems are completely refurbished and come with a one-year warranty. Currently available for SC-XRD: four D8 VENTUREs and one D8 QUEST.
Get the details

Upcoming Webinars

23 Jun 2020
Macromolecular Crystallography at Newcastle Structural Biology Lab

24 Jun 2020
The Importance of Good Sample Preparation

08 Jul 2020
Ways to Improve the Productivity of Your Single Crystal Diffractometer

09 Jul 2020
Elemental Analysis for the Iron, Steel & Metal Industry by OES, XRF and Combustion/Fusion

15 Jul 2020
Introduction to Analysis of Light Elements (C,S / O,N,H) in Inorganic Materials


On-Demand Webinars

Compositional analysis of archaeological ceramics by Handheld XRF

Fast, Accurate and Precise Quantification Results Using an Annular Silicon Drift Detector: Bruker’s XFlash FlatQUAD

Flexible and portable XRF mapping solutions for Art and Conservation: Bruker’s ELIO and CRONO spectrometers

Geochemical visualization in the geologist's toolkit: using micro-XRF and automated minerology in the mineral exploration workflow

Industrial Quality Control with the S6 JAGUAR

Investigation of concrete by means of micro-XRF

Large area SEM mapping using the Rapid Stage and its benefits for EDS, WDS and micro-XRF analysis

Latest developments in advanced 3D EBSD/EDS data processing with ESPRIT QUBE

Multiscale in-situ non-destructive micro-XRF scanning analysis: Implications for ore mineralogy, petrogenesis and micro-metallurgical assessments

New horizons of micro-XRF in Art and Conservation

Not Just for Experts: Pair Distribution Function Analysis in the Home Lab

Optimize Your Refinery Processes with S2 POLAR Elemental Analysis

Quickly analyze nutrients, additives, and contaminants in food, feed, supplements, and beverages with pXRF and TXRF

Rapid on-site trace element analysis of wastewater, sewage and industrial effluents

S2 PUMA Series 2 Launch: Find Out What's New in XRF!

Sorry we won't see you at EPDIC. Join our digital luncheon!

TRACER: The benchmark in handheld-XRF for Cultural Heritage

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