Bruker Nano, Inc.
Madison, Wisconsin, USA
Training Center

Thin Film
Applications Training


Course Options

High Resolution Diffraction
(Monday/Tuesday), 9am-4pm

This training course will show the theoretical fundamentals and data collection strategies for high resolution X-ray diffraction with the D8 family of diffractometers. The main focus is on the analysis of epitaxial thin films using the DIFFRAC.SUITE software packages including DIFFRAC.LEPTOS H.

X-ray Reflectometry (XRR) and Grazing Incidence Diffraction (GID)
(Wednesday/Thursday), 9am-4pm

This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Power Diffraction or High Resolution Diffraction course.

 

Attendance Fee

The course fee is $1,700 USD per attendee per two-day session. 

Class Size

Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis.

*Each participant will be provided with class materials and lunch daily. 

Training Dates

 High Resolution Diffraction (HRXRD):

November 2-3, 2020

 
 
X-ray Reflectometry (XRR) and Grazing Incidence Diffraction (GID)
 
November 4-5, 2020
 

 Bruker Nano, Inc.

5465 E. Cheryl Parkway
Madison, WI 53711. USA
(608) 276-3000

Register Now: Click Here

Contacts

For course content questions, please contact:

Ben Krueger
Applications Scientist, XRD
Benjamin.Kruger@bruker.com 

For registration and other questions, please contact:

Caitlin Heitman
Marketing Specialist
training.axs.us@bruker.com

 

Bruker Nano, Inc.
5465 E. Cheryl Parkway
Madison, WI 53711-11