Texture and Residual Stress Analysis
Wednesday/Thursday, 9am-4pm
This training course will show the different methods used for orientation and residual stress measurement and analysis, including the DIFFRAC.TEXTURE and DIFFRAC.LEPTOS S software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Powder Diffraction or 2 Dimensional Diffraction course.
*Each participant will be provided with class materials and lunch daily. |
Training Dates
2D Microdiffraction:
September 20-21, 2021
Bruker AXS LLC
Register Now: Click Here
Contacts
For course content questions, please contact:
Ben Krueger
Applications Scientist, XRD
Benjamin.Kruger@bruker.com
For registration and other questions, please contact:
Caitlin Heitman
Marketing Specialist
training.axs.us@bruker.com