Bruker Nano, Inc.
Madison, Wisconsin, USA
Training Center

S8 TIGER Series II with SPECTRAPLUS V4
(with option for mapping)
Applications Training


About the course

This hands-on course applies to users of SPECPlus on S8 WDXRF spectrometers. The training presents the theoretical fundamentals and preparation techniques as well as the methods in quantitative element analysis. The main focus is on performing X-ray fluorescence using the SPECPlus software package.

Attendance Fee

The course fee is $3,500 USD per person. 

Class Size

Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis.

*Each participant will be provided with class materials and lunch daily.

 

Course Agenda

Monday, 9am - 5pm

  • Welcome & Introduction
  • General XRF Theory with Specimen Preparation
  • Measuring Samples (Loader Program)
  • Retrieving Results (Results Manager Program)

Tuesday, 9am - 5pm

  • QuantExpress (Standardless) - Part 2
    • Evaluating results with Eval2 program
    • Drift Correction on QuantExpress
  • Quantitative Analysis - Part 1
    • Calibration Database
      • Materials
      • Preparation
      • Standard Samples

Wednesday, 9am - 5pm

  • QuantExpress (Standardless) - Part 2
  • Creating a measurement program with MethodWizard
  • Measuring Calibration and Drift Samples 
  • Calibration
    • Line Overlaps
    • Mathematical Models

Thursday, 9am - 5pm

  • Quantitative Analysis - Part 3
    • Extended calculations (Modules) - Optional
    • Specifications for Limits Testing
    • Results Formatting 
    • Creating the Finished Application
    • Testing the Application 
  • Course Wrap-up, Evaluations & Closing Remarks

Friday, 9am -3pm
*Please note: This session is only available when the optional Mapping Package has been purchased with the S8 TIGER 2.

  • Introduction to XRF2 Mapping 
    • Overview
    • Files
  • Mapping Tool program
    • Creating a mapping file that is used to measure a sample
  • Measuring samples with a mapping file
  • Viewing the results of a mapping measurement
  • Exporting results to a CSV file
  • Drift Correction of mapping program
  • Wrap-Up, Evaluations & Closing Remarks

Training Dates

May 3-7, 2021

August 9-13, 2021

November 8-12, 2021

 Bruker Nano, Inc.

5465 E. Cheryl Parkway
Madison, WI 53711. USA
(608) 276-3000

Register Now: Click Here

Contacts

For course content questions, please contact:

Julia Sedlmair
Applications Scientist, XRF
Julia.Sedlmair@bruker.com

 

For registration and other questions, please contact:

Caitlin Heitman
Marketing Specialist
training.axs.us@bruker.com

 

Bruker Nano, Inc.
5465 E. Cheryl Parkway
Madison, WI 53711-11