High Resolution Diffraction
This training course will show the theoretical fundamentals and data collection strategies for high resolution X-ray diffraction with the D8 family of diffractometers. The main focus is on the analysis of epitaxial thin films using the DIFFRAC.SUITE software packages including DIFFRAC.LEPTOS H.
X-ray Reflectometry (XRR) and Grazing Incidence Diffraction (GID)
This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Power Diffraction or High Resolution Diffraction course.