Applications Training Class
P/N 862-872400
Bruker Nano, Inc.
Madison, WI Training Center
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X-ray Reflectometry (XRR) and Grazing Incidence Diffraction (GID)
(Wednesday/Thursday), 9am-4pm
This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Power Diffraction or High Resolution Diffraction course.
Attendance Fee The course fee is $1,700 USD per attendee per two-day session. |
Class Size Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. |
*Each participant will be provided with class materials and lunch daily.
Contacts
For course content questions please contact:
Ben KruegerFor registration and other questions please contact:
Caitlin Heitman
Marketing Specialist
training.axs.us@bruker.com
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