Thin Film

Applications Training Class

P/N 862-872400

Bruker Nano, Inc.
Madison, WI Training Center

Bruker Training Facility
Bruker Nano, Inc.
5465 East Cheryl Pkwy
Madison, WI 53711-5373, USA
1 (800) 234- XRAY

Course Options

High Resolution Diffraction
(Monday/Tuesday), 9am-4pm

This training course will show the theoretical fundamentals and data collection strategies for high resolution X-ray diffraction with the D8 family of diffractometers. The main focus is on the analysis of epitaxial thin films using the DIFFRAC.SUITE software packages including DIFFRAC.LEPTOS H.

X-ray Reflectometry (XRR) and Grazing Incidence Diffraction (GID)
(Wednesday/Thursday), 9am-4pm

This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Power Diffraction or High Resolution Diffraction course.



Attendance Fee

The course fee is $1,700 USD per attendee per two-day session. 

Class Size

Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis.

*Each participant will be provided with class materials and lunch daily. 


For course content questions please contact:

Ben Krueger
Applications Scientist - XRD

For registration and other questions please contact:

Caitlin Heitman
Marketing Specialist