Applications Training Class
P/N 862-872400
Bruker Nano, Inc.
Madison, WI Training Center
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Texture and Residual Stress Analysis
Wednesday/Thursday, 9am-4pm
This training course will show the different methods used for orientation and residual stress measurement and analysis, including the DIFFRAC.TEXTURE and DIFFRAC.LEPTOS S software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Powder Diffraction or 2 Dimensional Diffraction course.
Attendance Fee The course fee is $1,700 USD per attendee per two-day session. |
Class Size Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. |
*Each participant will be provided with class materials and lunch daily.
Contacts
For course content questions please contact:
Ben KruegerFor registration and other questions please contact:
Caitlin Heitman
Marketing Specialist
training.axs.us@bruker.com
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