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High Resolution EBSD Pattern Simulation with ESPRIT DynamicS
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Electron Backscatter Diffraction (EBSD) is a powerful tool for the investigation of the microstructure of materials in the scanning electron microscope. The QUANTAX EBSD analysis system provides the analyst with an easy to use and advanced tool for EBSD measurement and evaluation, especially in conjunction with QUANTAX EDS for chemical analysis. In addition to these integrated analysis systems, we offer ESPRIT-DynamicS as a dedicated software for high-precision EBSD Kikuchi pattern analysis and simulation.
 ESPRIT-DynamicS can be used for vendor-independent analysis of experimental data irrespective of the specific EBSD hardware. ESPRIT-DynamicS incorporates all common simulation approaches for EBSD patterns, from simple kinematic simulations to sophisticated dynamical simulations which provide the highest level of realism. The software includes an automatic single-pattern calibration, with additional cross-correlation-based fine-tuning for quantitative best-fit pattern matching between simulation and experiment. The simulated data can be saved for subsequent re-use without the need for repeated recalculations. Various projection types are offered for the visualization of diffraction data, including the gnomonic projection for Kikuchi patterns, as well as stereographic and spherical projections for intuitive crystallographic analysis. Crystal data can be imported in various formats, including ESPRIT XML-phase list files from the main ESPRIT program and standard CIF files from databases.
Applications of ESPRIT DynamicS are found in advanced phase identification and orientation determination by direct Kikuchi pattern matching. Recent examples include the analysis of structural similarities in Kikuchi patterns of transformed iron oxide phases (Crystal Research and Technology 49 (2014) 490), the discrimination between quartz crystals of different chirality (Ultramicroscopy 149 (2015) 58), and orientation mapping of non-centrosymmetric phases (Applied Physics Letters 106 (2015) 072101). These examples demonstrate the unique possibilities which are available to the users of ESPRIT DynamicS.
Figure Caption: Screenshot of ESPRIT DynamicS showing a comparison of an experimental EBSD pattern from Gallium Phosphide (GaP) on the right side with a dynamical simulation on the left. The cross-correlation based best-fit pattern matching approach provides optimized values for the crystal orientation and detector geometry.
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