Thin Film Applications

Training Course Registration

High Resolution Diffraction
X-ray Reflectometry (XRR) and Grazing Incidence Diffraction (GID)
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Attendance Fee

The course fee is $1,700 USD per attendee per two-day session.

You may register for one or both of the class sections. 

Training Course Payment Options*
If you selected payment option "Other" please use the comment area below to provide details