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Join us for this exciting interactive webinar

Over 50 years ago, Richard Feynman put forth a challenge to the scientific community in his lecture "There's Plenty of Room at the Bottom" bringing light to the idea that we were at an impass in our ability to understand the world around us. At the time, we understood that the macroscopic properties of materials are manifest from their nanoscopic composition and structure, but our ability to routinely engineer and observe materials at these length scales was not possible. In today’s world, through theoretical modeling and modern fabrication methods, control of materials at these length scales is routine, not only in the research lab, but also in industrial processes. Measuring materials at these length scales has still proven to be quite difficult, often times requiring tools based on UHV sample chambers and carefully focused electron beams, sometimes requiring an entire building to be designed specifically for measuring critical dimensions on the atomic level. These techniques have become quintessential to understanding materials, but due to time consuming destructive sample preparation and limitations on sample morphology, are not suitable for routine materials analysis tasks.

X-ray metrology offers an ability to bridge these length scales on a routine basis. Unlike electron based techniques, X-ray based analysis can be carried out in air with no sample alteration required. Modern tools are designed for ease of use, requiring no external water cooling and little to no maintenance. Through the power of diffraction and fluorescence, critical dimensions ranging from the picometer strain within a material's unit cell to the thickness of films from atomic to micrometer thicknesses can be determined.  In addition, probe sizes on the order of 10’s of microns in both Micro XRF and  Micro XRD tools give the ability to create maps of a material's quantitative elemental analysis and atomic structure at microscopic and macroscopic length scales.

Please join us for a complimentary 45 minute interactive webinar exploring several case studies using Micro XRD (D8 DISCOVER) and Micro XRF (M4 TORNADO).  Jon Giencke, Applications Scientist-XRD, and Mike Beauchaine, Business Development Manager XRFi – Americas, will discuss the benefits of combining these analytical techniques to understand materials on the microscopic scale.

Can't make the live webcast? Register now and we'll send you the webinar slides and recording for later viewing at your convenience. All are welcome and, as always, there is no charge to attend.

We look forward to seeing you there!

Bruker Webinars